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User:Bci2/Books/StructuralTechniques

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Techniques and Instrumentation for Structure Determination

[edit]
I.C. Baianu, Ph.D.,M.Inst.P., Editor (with listed contributors)
Principles
Crystal
Diffraction
Uniform theory of diffraction
Crystallography
Paracrystalline
Quantum optics
X-rays
Electron
Neutron
Muon
X-ray diffraction
Electron diffraction
Neutron diffraction
Neutron scattering
Inelastic neutron scattering
Ionization cooling
Deep inelastic scattering
Timeline of microphysics
Automatic calculation of particle interaction or decay
S-matrix
List of materials analysis methods
List of neutrino experiments
Instruments
Optical microscope
Confocal microscope
Atomic force microscope
Electron microscope
Synchrotron
X-ray microscope
Energy filtered transmission electron microscopy (EFTEM)
Electron energy loss spectroscopy (EELS)
Field emission microscope
Scanning tunneling microscope
Scanning electron microscope (SEM)
Scanning transmission electron microscope (STEM)
Transmission Electron Aberration-corrected Microscope
ISIS
ISIS neutron source
Sudbury Neutrino Observatory
ATLAS experiment
Techniques
Microscopy
X-ray crystallography
X-ray scattering techniques
X-ray photoelectron spectroscopy (XPS)
Fourier transform spectroscopy
Hyperspectral imaging
2D-FT NMRI and Spectroscopy
MRI-NMRI
NMR microscopy
FT-NIRS (FT-NIR)
Chemical imaging
Fluorescence microscopy
Fluorescence correlation spectroscopy
Fluorescence cross-correlation spectroscopy
Circular dichroism
Vibrational spectroscopy
Vibrational circular dichroism
Raman spectroscopy
Microscope image processing
Electron microscopy
Diagnostic electron microscopy
HiRISE
High-resolution transmission electron microscopy (HRTEM)
Scanning confocal electron microscopy
Electron energy loss spectroscopy (EELS)
Energy filtered transmission electron microscopy (EFTEM)
Acronyms in microscopy
Nanoscience
Nanotechnology
Surface science
Ultramicroscopy- (journal)
Electron tomography
X-ray computed tomography (CT)
Virtopsy
Xenon-enhanced CT scanning
X-ray microtomography
Positron emission tomography
Raman microscopy
Neutron spin echo