File:Spvapparatus.png
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Summary
| Description |
Surface photovoltage measurements are an electro-optical method for the characterization of semiconductors. The figure schematically illustrates a surface photovoltage apparatus, including a chopped light source whose wavelength is scanned and a Kelvin probe used to measure the modulation of the surface potential. Drawn by Alison Chaiken using xfig. |
| Date | 24 December 2006 (original upload date) |
| Source | No machine-readable source provided. Own work assumed (based on copyright claims). |
| Author | No machine-readable author provided. Chaiken assumed (based on copyright claims). |
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Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the section entitled GNU Free Documentation License. |
  
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This file is licensed under the Creative Commons Attribution-Share Alike 3.0 Unported license. | |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 05:34, 24 December 2006 | | 844 × 420 (23 KB) | Chaiken | Surface photovoltage measurements are an electro-optical method for the characterization of semiconductors. The figure schematically illustrates a surface photovoltage apparatus, including a chopped ligh |
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