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Summary

Description
English: Observation with standard optical microscope between cross polarizers of Langmuir-Blodgett nanometric layers (bilayer thickness: 5.4nm) on silicon wafer and on Surf.
Observation au microscope optique entre polariseurs croisés d'un empilement de couches Langmuir-Blodgett (épaisseur bicouche:5.4nm) sur silicium et sur Surf.
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Source Nicolas Medard
Author Nanolane
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Nanolane, the copyright holder of this work, hereby publishes it under the following license:
GNU head Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the section entitled GNU Free Documentation License.

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12 January 2008

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Date/TimeThumbnailDimensionsUserComment
current12:25, 25 August 2009Thumbnail for version as of 12:25, 25 August 2009879 × 343 (31 KB)Nmedard{{Information |Description={{en|1=Observation with standard optical microscope between cross polarizers of Langmuir-Blodgett nanometric layers (bilayer thickness: 5.4nm) on silicon wafer and on Surf.}} Observation au microscope optique entre polariseurs c

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