File:PEEK control and ANAB nanotexture.png
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Summary
| Description |
English: Atomic Force Microscopy (AFM) image of the surface or polyether ether ketone (PEEK). Field of view: 1 μm x 1 μm. Left: original (as-machined) surface. Right: ANAB-treated surface exhibiting a 20 nm - 60 nm nano-texture. |
| Date | |
| Source | Own work |
| Author | Dshashkov |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 18:04, 23 October 2018 | | 834 × 261 (239 KB) | Dshashkov | Cross-wiki upload from wiki.riteme.site |
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